Week of Events
RAS Southeast Con Project Meetings
RAS Southeast Con Project Meetings
Students met to discuss and plan the robot for competing in hardware competition for Southeast <a href="http://Con.Co-sponsored" target="_blank" title="Con.Co-sponsored">Con.Co-sponsored by: Florida Polytechnic UniversityRoom: BARC-1142, Bldg: Barnett Applied Research Center, 4700 Polytechnic Circle, Lakeland, Florida, United States, 33805
Careers in Technology Spring Series 2025 – Peter James Kootsookos, PhD – 25 February 8pm EST / 7 pm CST
Careers in Technology Spring Series 2025 – Peter James Kootsookos, PhD – 25 February 8pm EST / 7 pm CST
Dr Kootsookos, IEEE Connecticut Section Chair. Dr Kootsookos will describe his career preparation. He will conduct a deep dive of his field as an expert in patent arbitration providing source code reviews. He is a teacher of telecommunications, signal & image processing, circuit analysis, digital hardware, and various software engineering courses at the University of... Read more
Data4 Conference – Feb 26th 2025 , Tampa FL
Data4 Conference – Feb 26th 2025 , Tampa FL
Dear IEEE CS Members,We are delighted to invite you to (https://www.data4con.com/), a conference by data professionals for data professionals to learn and grow. As an active member of our tech community, we would love to have you join <a href="http://us.When:" target="_blank" title="us.When:">us.When: February 26, 2025Where: Embarc Collective (Tampa)At Data4, tech leaders and innovators across industries... Read more
RAS Southeast Con Project Meetings
RAS Southeast Con Project Meetings
Students met to discuss and plan the robot for competing in hardware competition for Southeast <a href="http://Con.Co-sponsored" target="_blank" title="Con.Co-sponsored">Con.Co-sponsored by: Florida Polytechnic UniversityRoom: BARC-1123, Bldg: Barnett Applied Research Center, 4700 Polytechnic Circle, Lakeland, Florida, United States, 33805
FWCS PES/IAS EXCOM – FEBRUARY
FWCS PES/IAS EXCOM – FEBRUARY
Planning Meeting. VirtualVirtual: https://events.vtools.ieee.org/m/450340