Initial meeting of the P3405 Chiplet Interconnect Test and Repair Working Group.   Join from the meeting link https://ieeesa.webex.com/ieeesa/j.php?MTID=mb27347471cd50afaa68ea352cefb8fbf   Join by meeting number Meeting number (access code): 2341 747 […]

Agenda: Test Technology Standards Committee - Meeting Agenda (ieee.org) Webex link: https://ieeesa.webex.com/ieeesa/j.php?MTID=m32ae90cc538da01e9cbef0f1ac8ba3f8

Agenda (draft): Test Technology Standards Committee – Meeting Agenda (ieee.org) Webex link: https://ieeesa.webex.com/ieeesa/j.php?MTID=mb8b919eb743946be12177b57850aa970

Agenda (draft): Test Technology Standards Committee – Meeting Agenda (ieee.org) Webex link: https://ieeesa.webex.com/ieeesa/j.php?MTID=me6ec283bdcca3e2aab758a34952926f5

Agenda (draft): Test Technology Standards Committee – Meeting Agenda (ieee.org) Webex link: https://ieeesa.webex.com/ieeesa/j.php?MTID=ma86df2c2805969c4f0db4e0ef1a582c5  

Agenda: Test Technology Standards Committee – Meeting Agenda (ieee.org) Webex link: https://ieeesa.webex.com/ieeesa/j.php?MTID=m511ba34e81504c5938179c91dde2ac9f

Agenda:  Test Technology Standards Committee – Meeting Agenda (ieee.org) Webex link: https://ieeesa.webex.com/ieeesa/j.php?MTID=mfb1c91a5e72e4e3098e411f861270f78

Agenda:  Test Technology Standards Committee – Meeting Agenda (ieee.org) Webex link: To be updated.