Online Talk by IEEE Fellow Prof. Hoang Pham

#Reliability
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Salient features of the talk

Degradation Modelling: mathematical models for early detection of system degradation.
Early Detection: early detection considering time delays, self-healing, self-repair, and environmental uncertainties.


  Date and Time

  Location

  Hosts

  Registration



  • Date: 21 Apr 2025
  • Time: 01:00 AM UTC to 04:00 AM UTC
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  • Chengdu, Sichuan
  • China
  • Building: Main Building
  • Room Number: C1-213

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  • Starts 15 April 2025 04:00 PM UTC
  • Ends 20 April 2025 04:00 PM UTC
  • No Admission Charge


  Speakers

H. Pham

Topic:

Early Detection of Degraded Systems with Time Delays, Self-Repair Mechanisms, and Uncertain Operating Environment

In uncertain environments, industrial systems often degrade rather than fail abruptly, reducing efficiency. Such degradation may go undetected for a random period, unlike sudden failures that trigger alerts. This talk explores mathematical models for early detection of system degradation, considering time delays, self-healing, self-repair, and environmental uncertainties.

Biography:

Hoang Pham is a Distinguished Professor at Rutgers University. He is the editor-in-chief of the International Journal of Reliability, Quality and Safety Engineering and editor of the Springer Book Series in Reliability Engineering. Dr. Pham is the author or coauthor of 6 books and has published over 210 journal articles, 100 conference papers, and edited 18 books including Springer Handbook of Engineering Statistics (2nd ed., 2023) and Handbook in Reliability Engineering. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award. He is a Fellow of IEEE and IISE.





Agenda

10:00-10:30 Welcome, introduction & Photo session

10:30-12:00 Professor Hoang Pham: Early Detection of Degraded Systems with Time Delays,

       Self-Repair Mechanisms, and Uncertain Operating Environments