Improve Throughput in Characterization and Production
IEEE North Jersey Section Co-Sponsors the TALK: "Improve Throughput in Characterization and Production"
During this session, we will illustrate the most rapid and effective methodologies for validating your RF components through the application of real-world 5G and Wi-Fi scenarios. Participants can expect to streamline their testing operations with the following benefits:
- **Increased Speed**: Attain quicker product verification while maintaining accuracy.
- **Cost Efficiency**: Decrease testing expenses through optimized workflows.
- **Automation Excellence**: Take advantage of built-in automation and standard-compliant demodulation features to enhance throughput.
- **Improved Correlation**: Maintain consistency across research and development, characterization, and production setups, thereby reducing design cycles and accelerating time-to-market.
Furthermore, we will examine advanced tools and insights, including integrated sequencing and fast power servoing, to foster next-level efficiency and precision in your workflows.
This is an invaluable opportunity to transform your testing processes. We encourage you to reserve your place in this webinar to expedite your RF component validation. The agenda will cover:
- Challenges and best practices in RF component testing
- The application of integrated sequencing, fast power serving, and integrated EVM measurements for characterization
- Strategies to streamline test setups for characterization and production to optimize throughput.
Date and Time
Location
Hosts
Registration
- Date: 18 Feb 2025
- Time: 01:00 PM to 02:00 PM
- All times are (GMT-05:00) US/Eastern
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- Contact Event Host
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Ajay Poddar (akpoddar@ieee.org), Edip Niver (edip.niver@njit.edu), Durga Mishra (dmisra@njit.edu), (Anisha Apte (anisha_apte@ieee.org)
- Co-sponsored by IEEE North Jersey Section
Speakers
Markus Loerner of Rohde & Schwarz
Improve throughput in characterization and production
- **High Speed**: Achieve quicker product verification without sacrificing accuracy.
- **Cost Optimization**: Reduce testing expenses through efficient workflows.
- **Automation Excellence**: Utilize built-in automation and standard-compliant demodulation features to enhance throughput.
- **Enhanced Correlation**: Ensure consistency across R&D, characterization, and production setups, which will help reduce design cycles and accelerate the time to market.
Biography:
Markus Lörner is a globally recognized expert with extensive experience in the field of RF components. With over 16 years as a Senior Product Manager for signal generators and power meters, he has brought his deep expertise to his role as Market Segment Manager at Rohde & Schwarz for test and measurement solutions, focusing on the RF and microwave components market since 2017. Markus holds a Diploma Degree in Electrical Engineering from Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Germany.
Address:Rohde & Schwarz,
Konstantin Bick of Rohde & Schwarz
Demystifying next generation UWB: Key features, applications and test solutions
The latest generation of Ultrawideband (UWB) technology, based on the IEEE 802.15.4z standard, is gaining traction in applications like asset tracking and secure ranging. The next-generation UWB (NG-UWB) standard, IEEE 802.15.4ab, aims to improve these applications and enable new functionalities, such as sensing and low-latency communication. This webinar will cover the following topics:
- Current status of UWB technology and market updates, including FiRa 3.0
- Key features and applications of NG-UWB according to the IEEE 802.15.4ab draft standard
- Testing solutions from Rohde & Schwarz that address new requirements
- Practical implementations of NG-UWB technology
Biography:
