This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Joint Sponsors
-
IM/HFM
- Status
- Superseded Standard
- PAR Approval
- 2005-09-22
- Superseded by
- 1505.1-2019
- Board Approval
- 2008-09-26
- History
-
- Published:
- 2013-08-01
Working Group Details
- Society
- Society
- IEEE SA Board of Governors
- Standard Committee
- BOG/SCC20 - SCC20 - Test and Diagnosis for Electronic Systems
- Working Group
-
HI_WG - Hardware Interfaces Working Group
- IEEE Program Manager
- Jennifer Santulli
Contact Jennifer Santulli - Working Group Chair
- Stephen Mann
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
Standards approved by the IEEE SA Standards Board that are within the 10-year lifecycle.
1505.1-2019
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
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