This standard extends or expands the application of the IEEE Std 1687-2014 “Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device” to allow its use with a broad range of device interfaces and their associated controllers, by providing a translation mechanism for such interfaces. For example, these interfaces may include one or more of Inter-Integrated Circuit bus (I2C), Serial Peripheral Interface (SPI), and IEEE Std 1149.7, as well as the IEEE Std 1149.1 Test Access Port (TAP).
- Sponsor Committee
- C/TT - Test Technology
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- Active PAR
- PAR Approval
- 2025-02-13
Working Group Details
- Society
- IEEE Computer Society
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- C/TT - Test Technology
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IJTAG-NAPI - Interfaces and Controllers for Accessing 1687 Networks Working Group
- IEEE Program Manager
- Tom Thompson
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- Alfred Crouch
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