Surface Characterization.

Fulghum, J. E.; And Others

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Peer reviewed

ERIC Number: EJ395729

Record Type: CIJE

Publication Date: 1989

Pages: N/A

Abstractor: N/A

ISBN: N/A

ISSN: ISSN-0003-2700

EISSN: N/A

Surface Characterization.

Fulghum, J. E.; And Others

Analytical Chemistry, v61 n12 p243R-69R Jun 15 1989

This review is divided into the following analytical methods: ion spectroscopy, electron spectroscopy, scanning tunneling microscopy, atomic force microscopy, optical spectroscopy, desorption techniques, and X-ray techniques. (MVL)

Descriptors: Chemical Analysis, Chemical Reactions, Chemistry, College Science, Higher Education, Inorganic Chemistry, Instrumentation, Literature Reviews, Molecular Structure, Science Instruction, Spectroscopy, Structural Analysis (Science)

Publication Type: Journal Articles; Information Analyses

Education Level: N/A

Audience: Teachers; Researchers; Practitioners

Language: English

Sponsor: N/A

Authoring Institution: N/A

Grant or Contract Numbers: N/A