Implied Orders Tailored Testing: Simulation with the Stanford-Binet.

Cudeck, Robert; And Others

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Peer reviewed

ERIC Number: EJ235529

Record Type: Journal

Publication Date: 1980

Pages: N/A

Abstractor: N/A

ISBN: N/A

ISSN: N/A

EISSN: N/A

Implied Orders Tailored Testing: Simulation with the Stanford-Binet.

Cudeck, Robert; And Others

Applied Psychological Measurement, v4 n2 p157-63 Spr 1980

Tailored testing by Cliff's method of implied orders was simulated through the use of responses gathered during conventional administration of the Stanford-Binet Intelligence Scale. Tailoring eliminated approximately half the responses with only modest decreases in score reliability. (Author/BW)

Descriptors: Adaptive Testing, Computer Assisted Testing, Elementary Secondary Education, Intelligence Tests, Preschool Education, Test Construction, Test Reliability

Publication Type: Journal Articles; Reports - Research

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

Identifiers - Assessments and Surveys: Stanford Binet Intelligence Scale

Grant or Contract Numbers: N/A