ERIC Number: EJ1398045
Record Type: Journal
Publication Date: 2022
Pages: 17
Abstractor: As Provided
ISBN: N/A
ISSN: N/A
EISSN: EISSN-1551-2576
Exploring Assessment Approaches of STEM Learning in Extended Reality Environments
Chen, Xiaojun; Zhang, Ying; Wu, Wei; Luo, Yupeng; Shi, Yangming
International Journal of Technology in Teaching and Learning, v18 n2 p120-136 2022
This paper explores assessment approaches within the unique context of Extended Reality (XR) learning environments, which offer immersive and contextualized experiences. Focusing on STEM disciplines, the paper presents four distinctive XR-based assessment cases, exploring the discipline, context, purpose, and results of each. These insights aim to contribute to a richer understanding of learning assessment in XR environments and provide direction for future assessment designs in this emerging field.
Descriptors: STEM Education, Evaluation Methods, Computer Simulation, Educational Environment, Educational Assessment
International Journal of Technology in Teaching and Learning. Web site: https://sicet.org/journals/ijttl/
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A