ERIC Number: EJ1388582
Record Type: Journal
Publication Date: 2023
Pages: 21
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0895-7347
EISSN: EISSN-1532-4818
Multi-Group Generalizations of SIBTEST and Crossing-SIBTEST
Chalmers, R. Philip; Zheng, Guoguo
Applied Measurement in Education, v36 n2 p171-191 2023
This article presents generalizations of SIBTEST and crossing-SIBTEST statistics for differential item functioning (DIF) investigations involving more than two groups. After reviewing the original two-group setup for these statistics, a set of multigroup generalizations that support contrast matrices for joint tests of DIF are presented. To investigate the Type I error and power behavior of these generalizations, a Monte Carlo simulation study was then explored. Results indicated that the proposed generalizations are reasonably effective at recovering their respective population parameter definitions, maintain optimal Type I error control, have suitable power to detect uniform and non-uniform DIF, and in shorter tests are competitive with the generalized logistic regression and generalized Mantel-Haenszel tests for DIF.
Descriptors: Test Bias, Test Items, Item Response Theory, Error of Measurement, Monte Carlo Methods, Regression (Statistics), Generalization
Routledge. Available from: Taylor & Francis, Ltd. 530 Walnut Street Suite 850, Philadelphia, PA 19106. Tel: 800-354-1420; Tel: 215-625-8900; Fax: 215-207-0050; Web site: http://www.tandf.co.uk/journals
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A