ERIC Number: EJ1339351
Record Type: Journal
Publication Date: 2022
Pages: 19
Abstractor: As Provided
ISBN: N/A
ISSN: EISSN-2196-0739
EISSN: N/A
Generating Group-Level Scores under Response Accuracy-Time Conditional Dependence
Shin, Hyo Jeong; Jewsbury, Paul A.; van Rijn, Peter W.
Large-scale Assessments in Education, v10 Article 4 2022
The present paper investigates and examines the conditional dependencies between cognitive responses (RA; Response Accuracy) and process data, in particular, response times (RT) in large-scale educational assessments. Using two prominent large-scale assessments, NAEP and PISA, we examined the RA-RT conditional dependencies within each item in the measurement model and the structural model. Evidence for RA-RT conditional dependencies was observed in data from both programs, presenting a challenge in incorporating RT to the current operational models in NAEP and PISA that do not account for RA-RT conditional dependencies. However, inclusion of RT in the model had a relatively large contribution to improving the measurement of ability (residual variance decrease of 11% in NAEP and 18% in PISA), in contrast to relatively modest difference in parameter estimation from neglecting the conditional dependencies (e.g., estimated difference on residual variance of 1% in both NAEP and PISA). We conclude that the benefits of incorporating RT in the operational models for large-scale educational assessments may outweigh the costs.
Descriptors: Cognitive Processes, Reaction Time, Educational Assessment, Achievement Tests, International Assessment, Secondary School Students, Foreign Countries, National Competency Tests, Accuracy, Models, Measurement, Scores
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Publication Type: Journal Articles; Reports - Research
Education Level: Secondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: Program for International Student Assessment; National Assessment of Educational Progress
Grant or Contract Numbers: N/A