ERIC Number: EJ1320040
Record Type: Journal
Publication Date: 2021
Pages: 5
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0731-1745
EISSN: N/A
Machine Learning and Small Data
Educational Measurement: Issues and Practice, v40 n4 p8-12 Win 2021
Commonly used machine learning applications seem to relate to big data. This article provides a gentle review of machine learning and shows why machine learning can be applied to small data too. An example of applying machine learning to screen irregularity reports is presented. In the example, the support vector machine and multinomial naïve Bayes methods were used and compared. The performance of machine learning was compared to human experts in terms of flagging records to be excluded from equating. The application of machine learning seemed to be successful, although the data only consisted of a couple of thousand records. Recommendations in using machine learning are provided.
Descriptors: Artificial Intelligence, Man Machine Systems, Data, Bayesian Statistics, Program Effectiveness, Sampling, Equated Scores
Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://bibliotheek.ehb.be:2191/en-us
Publication Type: Journal Articles; Opinion Papers; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A