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ERIC Number: EJ1360541
Record Type: Journal
Publication Date: 2023-Feb
Pages: 20
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0013-1644
EISSN: EISSN-1552-3888
Using Simulated Annealing to Investigate Sensitivity of SEM to External Model Misspecification
Fisk, Charles L.; Harring, Jeffrey R.; Shen, Zuchao; Leite, Walter; Suen, King Yiu; Marcoulides, Katerina M.
Educational and Psychological Measurement, v83 n1 p73-92 Feb 2023
Sensitivity analyses encompass a broad set of post-analytic techniques that are characterized as measuring the potential impact of any factor that has an effect on some output variables of a model. This research focuses on the utility of the simulated annealing algorithm to automatically identify path configurations and parameter values of omitted confounders in structural equation modeling (SEM). An empirical example based on a past published study is used to illustrate how strongly related an omitted variable must be to model variables for the conclusions of an analysis to change. The algorithm is outlined in detail and the results stemming from the sensitivity analysis are discussed.
SAGE Publications. 2455 Teller Road, Thousand Oaks, CA 91320. Tel: 800-818-7243; Tel: 805-499-9774; Fax: 800-583-2665; e-mail: journals@sagepub.com; Web site: https://bibliotheek.ehb.be:2993
Publication Type: Journal Articles; Reports - Research
Education Level: Early Childhood Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A