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Learning Attribute Hierarchies from Data: Two Exploratory Approaches
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Wang, Chun; Lu, Jing – Journal of Educational and Behavioral Statistics, 2021
In cognitive diagnostic assessment, multiple fine-grained attributes are measured simultaneously. Attribute hierarchies are considered important structural features of cognitive diagnostic models (CDMs) that provide useful information about the nature of attributes. Templin and Bradshaw first introduced a hierarchical diagnostic classification…
Descriptors: Cognitive Measurement, Models, Vertical Organization, Classification
Performance of the S-X[superscript 2] Statistic for the Multidimensional Graded Response Model
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Su, Shiyang; Wang, Chun; Weiss, David J. – Educational and Psychological Measurement, 2021
S-X[superscript 2] is a popular item fit index that is available in commercial software packages such as "flex"MIRT. However, no research has systematically examined the performance of S-X[superscript 2] for detecting item misfit within the context of the multidimensional graded response model (MGRM). The primary goal of this study was…
Descriptors: Statistics, Goodness of Fit, Test Items, Models
Gaussian Variational Estimation for Multidimensional Item Response Theory
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Cho, April E.; Wang, Chun; Zhang, Xue; Xu, Gongjun – Grantee Submission, 2020
Multidimensional Item Response Theory (MIRT) is widely used in assessment and evaluation of educational and psychological tests. It models the individual response patterns by specifying functional relationship between individuals' multiple latent traits and their responses to test items. One major challenge in parameter estimation in MIRT is that…
Descriptors: Item Response Theory, Mathematics, Statistical Inference, Maximum Likelihood Statistics
Assessing the Item Response Theory with Covariate (IRT-C) Procedure for Ascertaining Differential Item Functioning
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Tay, Louis; Vermunt, Jeroen K.; Wang, Chun – International Journal of Testing, 2013
We evaluate the item response theory with covariates (IRT-C) procedure for assessing differential item functioning (DIF) without preknowledge of anchor items (Tay, Newman, & Vermunt, 2011). This procedure begins with a fully constrained baseline model, and candidate items are tested for uniform and/or nonuniform DIF using the Wald statistic.…
Descriptors: Item Response Theory, Test Bias, Models, Statistical Analysis
A Semiparametric Model for Jointly Analyzing Response Times and Accuracy in Computerized Testing
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Wang, Chun; Fan, Zhewen; Chang, Hua-Hua; Douglas, Jeffrey A. – Journal of Educational and Behavioral Statistics, 2013
The item response times (RTs) collected from computerized testing represent an underutilized type of information about items and examinees. In addition to knowing the examinees' responses to each item, we can investigate the amount of time examinees spend on each item. Current models for RTs mainly focus on parametric models, which have the…
Descriptors: Reaction Time, Computer Assisted Testing, Test Items, Accuracy
A Note on Comparing Examinee Classification Methods for Cognitive Diagnosis Models
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Huebner, Alan; Wang, Chun – Educational and Psychological Measurement, 2011
Cognitive diagnosis models have received much attention in the recent psychometric literature because of their potential to provide examinees with information regarding multiple fine-grained discretely defined skills, or attributes. This article discusses the issue of methods of examinee classification for cognitive diagnosis models, which are…
Descriptors: Classification, Diagnostic Tests, Thinking Skills, Models