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An Application of the Rasch Simple Logistic Model to Tailored Testing.
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Reckase, Mark D. – 1974
An application of the two-paramenter logistic (Rasch) model to tailored testing is presented. The model is discussed along with the maximum likelihood estimation of the ability parameters given the response pattern and easiness parameter estimates for the items. The technique has been programmed for use with an interactive computer terminal. Use…
Descriptors: Ability, Adaptive Testing, Computer Assisted Instruction, Difficulty Level