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| Hercules, David M. | 2 |
| Hercules, Shirley H. | 2 |
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Peer reviewedHercules, David M.; Hercules, Shirley H. – Journal of Chemical Education, 1984
Discusses two surface techniques: X-ray photoelectron spectroscopy (ESCA) and Auger electron spectroscopy (AES). Focuses on fundamental aspects of each technique, important features of instrumentation, and some examples of how ESCA and AES have been applied to analytical surface problems. (JN)
Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education
Peer reviewedHercules, David M.; Hercules, Shirley H. – Journal of Chemical Education, 1984
The fundamentals of two surface techniques--secondary-ion mass spectrometry (SIMS) and ion-scattering spectrometry (ISS)--are discussed. Examples of how these techniques have been applied to surface problems are provided. (JN)
Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education
