This is the second of two reviews dealing with analytical methods applicable to environmental chemistry. Methods are discussed under gas, liquid, or solid depending upon the state of the analyte during detection. (RH)

Discusses the need to encourage increasing numbers of persons to enter analytical chemistry, educate them thoroughly in basic chemical science, and expose them to the most modern methods and instrumentation. Examines some problems and several university's efforts to overcome them. (MVL)

Reviews literature on Raman spectroscopy from late 1981 to late 1983. Topic areas include: instrumentation and sampling; liquids and solutions; gases and matrix isolation; biological molecules; polymers; high-temperature and high-pressure studies; Raman microscopy; thin films and surfaces; resonance-enhanced and surface-enhanced spectroscopy; and…

Reviews techniques for online coupling of high-performance liquid chromatography with mass spectrometry, emphasizing those suitable for application to nonvolatile samples. Also summarizes the present status, strengths, and weaknesses of various techniques and discusses potential applications of recently developed techniques for combined liquid…

New equipment and apparatus for use in chemical education and research are discussed. (MLH)

Presents brief descriptions and sources of new apparatus and equipment related to chemistry. (RH)

Discusses two surface techniques: X-ray photoelectron spectroscopy (ESCA) and Auger electron spectroscopy (AES). Focuses on fundamental aspects of each technique, important features of instrumentation, and some examples of how ESCA and AES have been applied to analytical surface problems. (JN)

Examines recent developments in techniques for obtaining high-resolution nuclear magnetic resonance (NMR) spectra on solid samples, discussing the kinds of applications for which these techniques are well suited. Also discusses the characteristics of NMR of solids and generating magnetization for NMR in solids. (JN)

The fundamentals of two surface techniques--secondary-ion mass spectrometry (SIMS) and ion-scattering spectrometry (ISS)--are discussed. Examples of how these techniques have been applied to surface problems are provided. (JN)