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ERIC Number: EJ916753
Record Type: Journal
Publication Date: 2011-Jan
Pages: 5
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0033-3123
EISSN: N/A
Positive Definiteness via Off-Diagonal Scaling of a Symmetric Indefinite Matrix
Bentler, Peter M.; Yuan, Ke-Hai
Psychometrika, v76 n1 p119-123 Jan 2011
Indefinite symmetric matrices that are estimates of positive-definite population matrices occur in a variety of contexts such as correlation matrices computed from pairwise present missing data and multinormal based methods for discretized variables. This note describes a methodology for scaling selected off-diagonal rows and columns of such a matrix to achieve positive definiteness. As a contrast to recently developed ridge procedures, the proposed method does not need variables to contain measurement errors. When minimum trace factor analysis is used to implement the theory, only correlations that are associated with Heywood cases are shrunk.
Springer. 233 Spring Street, New York, NY 10013. Tel: 800-777-4643; Tel: 212-460-1500; Fax: 212-348-4505; e-mail: service-ny@springer.com; Web site: http://bibliotheek.ehb.be:2189
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A