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Psychometrika | 6 |
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Molenaar, Ivo W. | 6 |
Hoijtink, Herbert | 3 |
Sijtsma, Klaas | 2 |
Hemker, Bas T. | 1 |
Junker, Brian W. | 1 |
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Journal Articles | 6 |
Reports - Evaluative | 3 |
Reports - Research | 3 |
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Molenaar, Ivo W. – Psychometrika, 1983
Goodness of fit tests for the Rasch model are typically large-sample, global measures. This paper offers suggestions for small-sample exploratory techniques for examining the fit of item data to the Rasch model. (Author/JKS)
Descriptors: Goodness of Fit, Hypothesis Testing, Item Analysis, Latent Trait Theory

Sijtsma, Klaas; Molenaar, Ivo W. – Psychometrika, 1987
Three methods for estimating reliability are studied within the context of nonparametric item response theory. Two were proposed originally by Mokken and a third is developed in this paper. Using a Monte Carlo strategy, these three estimation methods are compared with four "classical" lower bounds to reliability. (Author/JAZ)
Descriptors: Estimation (Mathematics), Latent Trait Theory, Measurement Techniques, Monte Carlo Methods

Hemker, Bas T.; Sijtsma, Klaas; Molenaar, Ivo W.; Junker, Brian W. – Psychometrika, 1997
Stochastic ordering properties are investigated for a broad class of item response theory (IRT) models for which the monotone likelihood ratio does not hold. A taxonomy is given for nonparametric and parametric models for polytomous models based on the hierarchical relationship between the models. (SLD)
Descriptors: Item Response Theory, Mathematical Models, Nonparametric Statistics

Hoijtink, Herbert; Molenaar, Ivo W. – Psychometrika, 1997
This paper shows that a certain class of constrained latent class models may be interpreted as a special case of nonparametric multidimensional item response models. Parameters of this latent class model are estimated using an application of the Gibbs sampler, and model fit is investigated using posterior predictive checks. (SLD)
Descriptors: Goodness of Fit, Item Response Theory, Nonparametric Statistics, Prediction

Molenaar, Ivo W.; Hoijtink, Herbert – Psychometrika, 1990
Statistical properties of person fit indices are reviewed as indicators of the extent to which a person's score pattern is in agreement with a measurement model. Distribution of a fit index and ability-free fit evaluation are discussed. The null distribution was simulated for a test of 20 items. (SLD)
Descriptors: Item Banks, Item Response Theory, Mathematical Models, Monte Carlo Methods

Hoijtink, Herbert; Molenaar, Ivo W. – Psychometrika, 1992
The PARallELogram Analysis (PARELLA) model is a probabilistic parallelogram model that can be used for the measurement of latent attitudes or latent preferences. A method is presented for testing for differential item functioning (DIF) for the PARELLA model using the approach of D. Thissen and others (1988). (SLD)
Descriptors: Attitude Measures, Computer Simulation, Equations (Mathematics), Estimation (Mathematics)