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DeCarlo, Lawrence T. – Journal of Educational Measurement, 2023
A conceptualization of multiple-choice exams in terms of signal detection theory (SDT) leads to simple measures of item difficulty and item discrimination that are closely related to, but also distinct from, those used in classical item analysis (CIA). The theory defines a "true split," depending on whether or not examinees know an item,…
Descriptors: Multiple Choice Tests, Test Items, Item Analysis, Test Wiseness
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Masters, Geofferey N. – Journal of Educational Measurement, 1988
High item discrimination can indicate a special kind of measurement disturbance via an item that gives high-ability persons a special advantage. The measurement disturbance is described, which occurs when an item is sensitive to individual differences on a second, undesired dimension that is correlated with the variable intended to be measured.…
Descriptors: Academically Gifted, Item Analysis, Test Bias, Test Wiseness
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Vispoel, Walter P.; Clough, Sara J.; Bleiler, Timothy – Journal of Educational Measurement, 2005
Recent studies have shown that restricting review and answer change opportunities on computerized adaptive tests (CATs) to items within successive blocks reduces time spent in review, satisfies most examinees' desires for review, and controls against distortion in proficiency estimates resulting from intentional incorrect answering of items prior…
Descriptors: Mathematics, Item Analysis, Adaptive Testing, Computer Assisted Testing
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McMorris, Robert F.; And Others – Journal of Educational Measurement, 1972
In general, faults did make the items easier, with the largest effects occurring for cue and grammar contaminations. (Authors)
Descriptors: Achievement Tests, Grade 11, Item Analysis, Social Studies
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Huck, Schuyler W. – Journal of Educational Measurement, 1978
Providing examinees with advanced knowledge of the difficulty of an item led to an increase in test performance with no loss of reliability. This finding was consistent across several test formats. ( Author/JKS)
Descriptors: Difficulty Level, Feedback, Higher Education, Item Analysis