Descriptor
Source
| Journal of Chemical Education | 90 |
Author
Publication Type
Education Level
Audience
| Practitioners | 27 |
| Teachers | 20 |
| Researchers | 5 |
| Students | 2 |
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Peer reviewedEwing, Galen W., Ed. – Journal of Chemical Education, 1975
Descriptors: Chemical Analysis, Chemistry, Equipment, Instrumentation
Peer reviewedEwing, Galen W., Ed. – Journal of Chemical Education, 1974
Descriptors: Chemical Analysis, Chemistry, Instrumentation, Laboratory Equipment
Peer reviewedEwing, Galen W. – Journal of Chemical Education, 1971
Descriptors: Chemical Analysis, Chemistry, Chromatography, Equipment
Peer reviewedGoldman, James A., Ed. – Journal of Chemical Education, 1975
New equipment and apparatus for use in chemical education and research are discussed. (MLH)
Descriptors: Chemical Analysis, Chemistry, Chromatography, Equipment
Peer reviewedEwing, Galen W., Ed. – Journal of Chemical Education, 1975
Descriptors: Chemical Analysis, Equipment, Instrumentation, Laboratory Equipment
Peer reviewedGoldman, James A., Ed. – Journal of Chemical Education, 1976
Presents brief descriptions and sources of new apparatus and equipment related to chemistry. (RH)
Descriptors: Chemical Analysis, Chemistry, Equipment, Instrumentation
Peer reviewedGoldman, James A., Ed. – Journal of Chemical Education, 1976
Descriptors: Chemical Analysis, Chemistry, Equipment, Instrumentation
Peer reviewedHercules, David M.; Hercules, Shirley H. – Journal of Chemical Education, 1984
Discusses two surface techniques: X-ray photoelectron spectroscopy (ESCA) and Auger electron spectroscopy (AES). Focuses on fundamental aspects of each technique, important features of instrumentation, and some examples of how ESCA and AES have been applied to analytical surface problems. (JN)
Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education
Peer reviewedHercules, David M.; Hercules, Shirley H. – Journal of Chemical Education, 1984
The fundamentals of two surface techniques--secondary-ion mass spectrometry (SIMS) and ion-scattering spectrometry (ISS)--are discussed. Examples of how these techniques have been applied to surface problems are provided. (JN)
Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education
Peer reviewedEwing, Galen W., Ed. – Journal of Chemical Education, 1976
Descriptors: Chemical Analysis, Chemistry, Chromatography, Equipment
Peer reviewedChan, W. H. – Journal of Chemical Education, 1987
Described is an experiment to investigate the plasticizer content in polyvinyl chloride (PVC) products. The experiment is designed for college students using an instrumental analysis laboratory. (RH)
Descriptors: Chemical Analysis, Chemistry, College Science, Instrumentation
Peer reviewedPleva, Michael A.; Settle, Frank A., Jr. – Journal of Chemical Education, 1985
Presents two lists: (1) important considerations for any total chemical analysis and (2) a condensed version that can be used by students to evaluate each analytical procedure. Benefits of using the condensed version (such as seeing that instrumentation is only one of several components of an analysis) are noted. (JN)
Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education
Peer reviewedGoldman, James A., Ed. – Journal of Chemical Education, 1976
Describes numerous pieces of equipment for the chemistry laboratory. (MLH)
Descriptors: Chemical Analysis, Chemistry, Educational Media, Equipment
Peer reviewedGoldman, James A., Ed. – Journal of Chemical Education, 1975
Descriptions of new equipment and materials are provided. Sources of the items are given. nRWH)
Descriptors: Chemical Analysis, Chemistry, Educational Media, Equipment
Peer reviewedEwing, Galen W., Ed. – Journal of Chemical Education, 1975
Descriptors: Chemical Analysis, Instrumentation, Laboratory Equipment, Laboratory Techniques
