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Peer reviewedHercules, David M.; Hercules, Shirley H. – Journal of Chemical Education, 1984
The fundamentals of two surface techniques--secondary-ion mass spectrometry (SIMS) and ion-scattering spectrometry (ISS)--are discussed. Examples of how these techniques have been applied to surface problems are provided. (JN)
Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education
