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Wicherts, Jelte M.; Dolan, Conor V.; Hessen, David J.; Oosterveld, Paul; van Baal, G. Caroline M.; Boomsma, Dorret I.; Span, Mark M. – Intelligence, 2004
The gains of scores on standardized intelligence tests (i.e., Flynn effect) have been the subject of extensive debate concerning their nature, causes, and implications. The aim of the present study is to investigate whether five intelligence tests are measurement invariant with respect to cohort. Measurement invariance implies that gains over the…
Descriptors: Intelligence Tests, Aptitude Tests, Factor Analysis, Measurement