ERIC Number: EJ1242866
Record Type: Journal
Publication Date: 2020
Pages: 19
Abstractor: As Provided
ISBN: N/A
ISSN: EISSN-1555-5062
EISSN: N/A
Get the Most from Your Survey: An Application of Rasch Analysis for Education Leaders
Bailes, Lauren P.; Nandakumar, Ratna
International Journal of Education Policy and Leadership, v16 n2 2020
High-quality measurement tools are critical to school improvement efforts. Education researchers frequently employ surveys in order to assess a host of variables associated with school improvement. This article asserts that Rasch modeling techniques enhance the quality of a measurement tool because they comprise elements of both qualitative and quantitative research approaches, and because Rasch modeling corrects the erroneous conclusions that result from the errors associated with ordinal response scale data. This article illustrates, with specific attention to the needs of education leaders and researchers, how the Rasch measurement model gauges the usefulness of survey instruments. This study illustrates the benefits of Rasch modeling using the scale that measures teacher external political efficacy (TEPE). Findings show that a set of four items captures this domain well.
Descriptors: Surveys, Evaluation Methods, Item Response Theory, Administrator Role, Measurement Techniques, Test Construction, Urban Schools, Elementary Schools, Grade 3, Grade 4, Grade 5, Teacher Attitudes, Teacher Characteristics, Construct Validity, Test Reliability, Educational Policy, Self Efficacy
PDK International, Faculty of Education at Simon Fraser University, and College of Education and Human Development at George Mason University. Web site: http://journals.sfu.ca/ijepl/index.php/ijepl
Publication Type: Journal Articles; Reports - Research
Education Level: Elementary Education; Early Childhood Education; Grade 3; Primary Education; Grade 4; Intermediate Grades; Grade 5; Middle Schools
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A