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van der Linden, Wim J.; Diao, Qi – Journal of Educational Measurement, 2011
In automated test assembly (ATA), the methodology of mixed-integer programming is used to select test items from an item bank to meet the specifications for a desired test form and optimize its measurement accuracy. The same methodology can be used to automate the formatting of the set of selected items into the actual test form. Three different…
Descriptors: Test Items, Test Format, Test Construction, Item Banks
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van der Linden, Wim J.; Ariel, Adelaide; Veldkamp, Bernard P. – Journal of Educational and Behavioral Statistics, 2006
Test-item writing efforts typically results in item pools with an undesirable correlational structure between the content attributes of the items and their statistical information. If such pools are used in computerized adaptive testing (CAT), the algorithm may be forced to select items with less than optimal information, that violate the content…
Descriptors: Adaptive Testing, Computer Assisted Testing, Test Items, Item Banks
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Robin, Frédéric; van der Linden, Wim J.; Eignor, Daniel R.; Steffen, Manfred; Stocking, Martha L. – ETS Research Report Series, 2005
The relatively new shadow test approach (STA) to computerized adaptive testing (CAT) proposed by Wim van der Linden is a potentially attractive alternative to the weighted deviation algorithm (WDA) implemented at ETS. However, it has not been evaluated under testing conditions representative of current ETS testing programs. Of interest was whether…
Descriptors: Test Construction, Computer Assisted Testing, Simulation, Evaluation Methods
van der Linden, Wim J.; Reese, Lynda M. – 1997
A model for constrained computerized adaptive testing is proposed in which the information in the test at the ability estimate is maximized subject to a large variety of possible constraints on the contents of the test. At each item-selection step, a full test is first assembled to have maximum information at the current ability estimate fixing…
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Computer Simulation