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Geerlings, Hanneke; Glas, Cees A. W.; van der Linden, Wim J. – Psychometrika, 2011
An application of a hierarchical IRT model for items in families generated through the application of different combinations of design rules is discussed. Within the families, the items are assumed to differ only in surface features. The parameters of the model are estimated in a Bayesian framework, using a data-augmented Gibbs sampler. An obvious…
Descriptors: Simulation, Intelligence Tests, Item Response Theory, Models
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van der Linden, Wim J. – Applied Psychological Measurement, 2009
An adaptive testing method is presented that controls the speededness of a test using predictions of the test takers' response times on the candidate items in the pool. Two different types of predictions are investigated: posterior predictions given the actual response times on the items already administered and posterior predictions that use the…
Descriptors: Simulation, Adaptive Testing, Vocational Aptitude, Bayesian Statistics
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Glas, Cees A. W.; van der Linden, Wim J. – Applied Psychological Measurement, 2003
Developed a multilevel item response (IRT) model that allows for differences between the distributions of item parameters of families of item clones. Results from simulation studies based on an item pool from the Law School Admission Test illustrate the accuracy of the item pool calibration and adaptive testing procedures based on the model. (SLD)
Descriptors: Adaptive Testing, Computer Assisted Testing, Item Banks, Item Response Theory
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Robin, Frédéric; van der Linden, Wim J.; Eignor, Daniel R.; Steffen, Manfred; Stocking, Martha L. – ETS Research Report Series, 2005
The relatively new shadow test approach (STA) to computerized adaptive testing (CAT) proposed by Wim van der Linden is a potentially attractive alternative to the weighted deviation algorithm (WDA) implemented at ETS. However, it has not been evaluated under testing conditions representative of current ETS testing programs. Of interest was whether…
Descriptors: Test Construction, Computer Assisted Testing, Simulation, Evaluation Methods