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van der Linden, Wim J. | 6 |
Mellenbergh, Gideon J. | 1 |
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Reports - Research | 3 |
Journal Articles | 2 |
Reports - Evaluative | 2 |
Speeches/Meeting Papers | 2 |
Reports - General | 1 |
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van der Linden, Wim J.; Mellenbergh, Gideon J. – 1977
From a decision theoretic viewpoint, a general coefficient (delta) for tests is derived. The coefficient is applied to three kinds of decision situations. The first situation involves a true score estimated by a function of the observed score of a subject on a test (point estimation). Using the squared error loss function and Kelley's formula for…
Descriptors: Decision Making, Equations (Mathematics), Estimation (Mathematics), Probability
van der Linden, Wim J. – 1981
It has often been argued that all techniques of standard setting are arbitrary and likely to yield different results for different techniques or persons. This paper deals with a related but hitherto ignored aspect of standard setting, namely, the possibility that Angoff or Nedelsky judges misspecify the probabilities of the borderline student's…
Descriptors: Error of Measurement, Evaluators, Foreign Countries, Latent Trait Theory

van der Linden, Wim J. – Applied Psychological Measurement, 1979
The restrictions on item difficulties that must be met when binomial models are applied to domain-referenced testing are examined. Both a deterministic and a stochastic conception of item responses are discussed with respect to difficulty and Guttman-type items. (Author/BH)
Descriptors: Difficulty Level, Item Sampling, Latent Trait Theory, Mathematical Models

van der Linden, Wim J. – Journal of Educational Statistics, 1978
Macready and Dayton introduced two probabilistic models for mastery assessment based on an idealistic all-or-none conception of mastery. Alternatively, an application of latent trait theory to mastery testing is proposed (a three parameter logistic model) as a more plausible model for test theory. (Author/CTM)
Descriptors: Criterion Referenced Tests, Guessing (Tests), Item Analysis, Latent Trait Theory
van der Linden, Wim J. – 1980
Latent class models for mastery testing differ from continuum models in that they do not postulate a latent mastery continuum but conceive mastery and non-mastery as two latent classes, each characterized by different probabilities of success. Several researchers use a simple latent class model that is basically a simultaneous application of the…
Descriptors: Cutting Scores, Error Patterns, Estimation (Mathematics), Foreign Countries
van der Linden, Wim J. – 1982
A latent trait method is presented to investigate the possibility that Angoff or Nedelsky judges specify inconsistent probabilities in standard setting techniques for objectives-based instructional programs. It is suggested that judges frequently specify a low probability of success for an easy item but a large probability for a hard item. The…
Descriptors: Criterion Referenced Tests, Cutting Scores, Error of Measurement, Interrater Reliability