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Oranje, Andreas; Li, Deping; Kandathil, Mathew – ETS Research Report Series, 2009
Several complex sample standard error estimators based on linearization and resampling for the latent regression model of the National Assessment of Educational Progress (NAEP) are studied with respect to design choices such as number of items, number of regressors, and the efficiency of the sample. This paper provides an evaluation of the extent…
Descriptors: Error of Measurement, Computation, Regression (Statistics), National Competency Tests
Li, Deping; Oranje, Andreas; Jiang, Yanlin – Journal of Educational and Behavioral Statistics, 2009
To find population proficiency distributions, a two-level hierarchical linear model may be applied to large-scale survey assessments such as the National Assessment of Educational Progress (NAEP). The model and parameter estimation are developed and a simulation was carried out to evaluate parameter recovery. Subsequently, both a hierarchical and…
Descriptors: Computation, National Competency Tests, Measurement, Regression (Statistics)
Li, Deping; Oranje, Andreas – ETS Research Report Series, 2007
Two versions of a general method for approximating standard error of regression effect estimates within an IRT-based latent regression model are compared. The general method is based on Binder's (1983) approach, accounting for complex samples and finite populations by Taylor series linearization. In contrast, the current National Assessment of…
Descriptors: Error of Measurement, Regression (Statistics), Trend Analysis, National Competency Tests