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Liang, Tie; Wells, Craig S.; Hambleton, Ronald K. – Journal of Educational Measurement, 2014
As item response theory has been more widely applied, investigating the fit of a parametric model becomes an important part of the measurement process. There is a lack of promising solutions to the detection of model misfit in IRT. Douglas and Cohen introduced a general nonparametric approach, RISE (Root Integrated Squared Error), for detecting…
Descriptors: Item Response Theory, Measurement Techniques, Nonparametric Statistics, Models
Deng, Nina; Han, Kyung T.; Hambleton, Ronald K. – Applied Psychological Measurement, 2013
DIMPACK Version 1.0 for assessing test dimensionality based on a nonparametric conditional covariance approach is reviewed. This software was originally distributed by Assessment Systems Corporation and now can be freely accessed online. The software consists of Windows-based interfaces of three components: DIMTEST, DETECT, and CCPROX/HAC, which…
Descriptors: Item Response Theory, Nonparametric Statistics, Statistical Analysis, Computer Software
Hambleton, Ronald K.; Cook, Linda L. – 1978
The purpose of the present research was to study, systematically, the "goodness-of-fit" of the one-, two-, and three-parameter logistic models. We studied, using computer-simulated test data, the effects of four variables: variation in item discrimination parameters, the average value of the pseudo-chance level parameters, test length,…
Descriptors: Career Development, Difficulty Level, Goodness of Fit, Item Analysis

Swaminathan, Hariharan; Hambleton, Ronald K.; Sireci, Stephen G.; Xing, Dehui; Rizavi, Saba M. – Applied Psychological Measurement, 2003
Descriptors: Bayesian Statistics, Estimation (Mathematics), Item Response Theory, Sample Size
Hambleton, Ronald K.; And Others – 1990
Item response theory (IRT) model parameter estimates have considerable merit and open up new directions for test development, but misleading results are often obtained because of errors in the item parameter estimates. The problem of the effects of item parameter estimation errors on the test development process is discussed, and the seriousness…
Descriptors: Error of Measurement, Estimation (Mathematics), Item Response Theory, Sampling