Descriptor
| Cognitive Ability | 1 |
| Evaluation Research | 1 |
| Intelligence Tests | 1 |
| Pain | 1 |
| Research Methodology | 1 |
| Response Style (Tests) | 1 |
| Scores | 1 |
| Simulation | 1 |
| Test Bias | 1 |
| Test Validity | 1 |
| Undergraduate Students | 1 |
| More ▼ | |
Source
| Assessment | 1 |
Author
| Bianchini, Kevin J. | 1 |
| Ciota, Megan A. | 1 |
| Etherton, Joseph L. | 1 |
| Greve, Kevin W. | 1 |
Publication Type
| Journal Articles | 1 |
| Reports - Research | 1 |
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Peer reviewed
Direct linkEtherton, Joseph L.; Bianchini, Kevin J.; Ciota, Megan A.; Greve, Kevin W. – Assessment, 2005
Reliable Digit Span (RDS) is an indicator used to assess the validity of cognitive test performance. Scores of 7 or lower suggest poor effort or negative response bias. The possibility that RDS scores are also affected by pain has not been addressed thus potentially threatening RDS specificity. The current study used cold pressor-induced pain to…
Descriptors: Response Style (Tests), Simulation, Intelligence Tests, Pain
