Analytical Chemistry of Surfaces: Part III. Ion Spectroscopy.

Hercules, David M.; Hercules, Shirley H.

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Peer reviewed

ERIC Number: EJ303396

Record Type: Journal

Publication Date: 1984

Pages: N/A

Abstractor: N/A

ISBN: N/A

ISSN: N/A

EISSN: N/A

Analytical Chemistry of Surfaces: Part III. Ion Spectroscopy.

Hercules, David M.; Hercules, Shirley H.

Journal of Chemical Education, v61 n7 p592-99 Jul 1984

The fundamentals of two surface techniques--secondary-ion mass spectrometry (SIMS) and ion-scattering spectrometry (ISS)--are discussed. Examples of how these techniques have been applied to surface problems are provided. (JN)

Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education, Instrumentation, Laboratory Procedures, Spectroscopy

Publication Type: Reports - General; Journal Articles

Education Level: N/A

Audience: Teachers; Practitioners

Language: English

Sponsor: N/A

Authoring Institution: N/A

Grant or Contract Numbers: N/A