
ERIC Number: EJ413760
Record Type: Journal
Publication Date: 1986
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-1046-3364
EISSN: N/A
Predicting Success for High-Risk Students: A Study of Long- and Short-Term Relationships of WAIS and SAT with the Academic Achievement of High-Risk Students.
Ruble, Virgil E.; Schurr, K. Terry
Research & Teaching in Developmental Education, v2 n2 p4-12 Apr 1986
Describes a study of the effectiveness of the Scholastic Aptitude Test (SAT), high school graduation class percentile, and the Wechsler Adult Intelligence Scale (WAIS), as predictors of short- and long-term academic achievement among a sample of 58 high-risk college freshmen who participated in 1-year special studies program. (PAA)
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: Researchers; Administrators; Practitioners
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: SAT (College Admission Test); Wechsler Adult Intelligence Scale
Grant or Contract Numbers: N/A