Abstract:
Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted t...Show MoreScope:This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is res...Show More
Purpose:This standard is written to clear up confusion relating to the terms and definitions concerning DACs. Test methods are defined with expected output and analysis of the da...Show More
Metadata
Abstract:
Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
Scope:
This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs). It is restricted to monolithic, hybrid, and module DACs and does not cover systems encompassing DACs.
Purpose:
This standard is written to clear up confusion relating to the terms and definitions concerning DACs. Test methods are defined with expected output and analysis of the data generated from these test methods. Product specifications are defined in clear terms that will be understandable by all international users and manufacturers.
Date of Publication: 10 February 2012
Electronic ISBN:978-0-7381-7147-0
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=6152111
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Test Method ,
- Analog-to-digital Converter ,
- IEEE Standard ,
- Frequency Response ,
- Impulse Response ,
- Step Change ,
- Sine Wave ,
- Settling Time ,
- Harmonic Components ,
- Harmonic Distortion ,
- Least Significant Bit ,
- Reference Input ,
- Total Harmonic Distortion ,
- Update Rate ,
- Analog Output ,
- Digital Code ,
- Static Gain ,
- Power Supply Voltage ,
- Digital Input ,
- Gray Code ,
- Analog Filter ,
- Input Code ,
- Transition Duration ,
- Binary Code ,
- Input Signal ,
- Gain Error ,
- Digital Signal ,
- Slew Rate ,
- Output Signal ,
- Ideal Output
- Author Keywords
- DAC ,
- digital-to-analog converter ,
- IEEE 1658 ,
- SFDR ,
- SNR ,
- spectrum ,
- test terminology ,
- test methods
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Test Method ,
- Analog-to-digital Converter ,
- IEEE Standard ,
- Frequency Response ,
- Impulse Response ,
- Step Change ,
- Sine Wave ,
- Settling Time ,
- Harmonic Components ,
- Harmonic Distortion ,
- Least Significant Bit ,
- Reference Input ,
- Total Harmonic Distortion ,
- Update Rate ,
- Analog Output ,
- Digital Code ,
- Static Gain ,
- Power Supply Voltage ,
- Digital Input ,
- Gray Code ,
- Analog Filter ,
- Input Code ,
- Transition Duration ,
- Binary Code ,
- Input Signal ,
- Gain Error ,
- Digital Signal ,
- Slew Rate ,
- Output Signal ,
- Ideal Output
- Author Keywords
- DAC ,
- digital-to-analog converter ,
- IEEE 1658 ,
- SFDR ,
- SNR ,
- spectrum ,
- test terminology ,
- test methods
