Abstract:
A language useful for describing automatic test equipment (ATE) instrumentation and configurations, as well as interface test adapters (ITA), is defined. Principally inte...Show MoreMetadata
Abstract:
A language useful for describing automatic test equipment (ATE) instrumentation and configurations, as well as interface test adapters (ITA), is defined. Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments.
Date of Publication: 31 December 1997
ISBN Information:
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=4507
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms