Abstract:
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC t...Show MoreMetadata
Abstract:
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test education at the collegiate level is cited as one of the main sources for this problem. In response to this situation, the Department of Electrical and Computer Engineering at the Ohio State University, Columbus, has partnered with Texas Instruments to establish an IC test-engineering-oriented course. The course objectives are to familiarize students with industrial testing techniques and to help students obtain the fundamental skill sets required to be competent mixed-signal IC test engineers. A novel laboratory pedagogy is developed to achieve these objectives. The results of the classroom assignments and the feedback provided by students, faculty, and industry representatives indicate that the approach has successfully achieved these goals.
Published in: IEEE Transactions on Education ( Volume: 53, Issue: 4, November 2010)
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Ohio State ,
- Semiconductor Industry ,
- Texas Instruments ,
- Data Rate ,
- Test Method ,
- Testing Procedure ,
- Linear System ,
- Frequency Response ,
- Graduate Students ,
- Quality Testing ,
- Data Sheet ,
- Increase In Function ,
- State Parameters ,
- Digital Signal Processing ,
- Debugging ,
- Industrial Engineering ,
- Digital Circuits ,
- Types Of Courses ,
- Virtual Laboratory ,
- Test Plan ,
- Offset Error ,
- Evaluation Module ,
- Output Code ,
- Signal Propagation ,
- Engineering Education ,
- Limited Time ,
- Testing Technology ,
- Power Electronics ,
- Test Equipment ,
- Testing Tools
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Ohio State ,
- Semiconductor Industry ,
- Texas Instruments ,
- Data Rate ,
- Test Method ,
- Testing Procedure ,
- Linear System ,
- Frequency Response ,
- Graduate Students ,
- Quality Testing ,
- Data Sheet ,
- Increase In Function ,
- State Parameters ,
- Digital Signal Processing ,
- Debugging ,
- Industrial Engineering ,
- Digital Circuits ,
- Types Of Courses ,
- Virtual Laboratory ,
- Test Plan ,
- Offset Error ,
- Evaluation Module ,
- Output Code ,
- Signal Propagation ,
- Engineering Education ,
- Limited Time ,
- Testing Technology ,
- Power Electronics ,
- Test Equipment ,
- Testing Tools
- Author Keywords