Abstract:
Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with...Show MoreMetadata
Abstract:
Superseded by C62.36-1994. Methods for testing and measuring the characteristics of surge protectors used in low voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 V dc are established. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime. Packaged single gas-tube, air-gap, varistor, or avalanche junction surge-protective devices are not covered, nor are test methods for low-voltage power circuit applications.
Date of Publication: 10 February 1992
Electronic ISBN:978-1-5593-7161-2
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=2928
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- IEEE Standard ,
- Signaling Circuits ,
- Surge Protective Devices ,
- Low-voltage Circuit ,
- Less Than Or Equal ,
- Nonlinear Element ,
- Short-circuit ,
- Quiescent State ,
- Failure Modes ,
- Testing Purposes ,
- Bit Error Rate ,
- Open Voltage ,
- Maximum Voltage ,
- Load Resistance ,
- Voltage Levels ,
- Test Temperature ,
- Insertion Loss ,
- Current Waveforms ,
- Load Current ,
- Impulse Propagation ,
- Test Circuit ,
- Terminal Pair ,
- Rated Voltage ,
- Return Loss ,
- Basic Configuration ,
- Baud Rate ,
- Bit Error ,
- Short-circuit Current ,
- Impedance
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- IEEE Standard ,
- Signaling Circuits ,
- Surge Protective Devices ,
- Low-voltage Circuit ,
- Less Than Or Equal ,
- Nonlinear Element ,
- Short-circuit ,
- Quiescent State ,
- Failure Modes ,
- Testing Purposes ,
- Bit Error Rate ,
- Open Voltage ,
- Maximum Voltage ,
- Load Resistance ,
- Voltage Levels ,
- Test Temperature ,
- Insertion Loss ,
- Current Waveforms ,
- Load Current ,
- Impulse Propagation ,
- Test Circuit ,
- Terminal Pair ,
- Rated Voltage ,
- Return Loss ,
- Basic Configuration ,
- Baud Rate ,
- Bit Error ,
- Short-circuit Current ,
- Impedance
- Author Keywords
