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C37.41-2016 - IEEE Standard Design Tests for High-Voltage (>1000 V) Fuses and Accessories | IEEE Standard | IEEE Xplore

C37.41-2016 - IEEE Standard Design Tests for High-Voltage (>1000 V) Fuses and Accessories

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Abstract:

Required procedures for performing design tests for high-voltage fuses, as well as for fuse disconnecting switches, are specified. These design tests, as appropriate to a...Show More
Scope:This standard specifies design test requirements for high-voltage (above 1000 V) fuses and accessories for use on ac electrical distribution systems. Devices with rated m...Show More
Purpose:This standard specifies the minimum testing requirements for fuses and related devices. Such standardization is needed to ensure uniform minimum product testing for devic...Show More

Abstract:

Required procedures for performing design tests for high-voltage fuses, as well as for fuse disconnecting switches, are specified. These design tests, as appropriate to a particular device, include the following test types: dielectric, interrupting, radio-influence, temperature-rise, time-current, manual-operation, liquid-tightness, thermal-cycle, bolt-torque, withstand tests for motor circuit fuses, expulsion fuses using polymeric insulators, load-break, and short-time current.
Scope:
This standard specifies design test requirements for high-voltage (above 1000 V) fuses and accessories for use on ac electrical distribution systems. Devices with rated maximum voltages to 170 kV are covered. The devices to which this standard applies are as follows: a) Expulsion fuses (including fuse cutouts); b) Current-limiting fuses; c) Items a) and b) used in fuse-enclosure packages; d) Fuse supports of the type intended for use with fuses and fuse disconnecting switches; e) Disconnecting devices (fuse disconnecting switches, disconnecting switches, and disconnecting cutouts) created by the use of a removable fuse unit or switch blade in a fuse support;...
Purpose:
This standard specifies the minimum testing requirements for fuses and related devices. Such standardization is needed to ensure uniform minimum product testing for devices within the document scope. Test areas covered are based on historical experience.
Date of Publication: 09 December 2016
Electronic ISBN:978-1-5044-2393-9
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=7781573

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