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61671-5-2016 - IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description | IEEE Standard | IEEE Xplore

61671-5-2016 - IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description

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Status: active - Approved
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Abstract:

An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in ...Show More
Scope:This standard defines an exchange format, utilizing XML, for both the static description of a test adapter bydefining the interface between the UUT and the test station, ...Show More

Abstract:

An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.
Scope:
This standard defines an exchange format, utilizing XML, for both the static description of a test adapter bydefining the interface between the UUT and the test station, and the specific description of test adapter instance information.
Date of Publication: 08 April 2016
Electronic ISBN:978-1-5044-0866-0
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=7454656

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