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1445-1998 - IEEE Standard for Digital Test Interchange Format (DTIF) | IEEE Standard | IEEE Xplore

1445-1998 - IEEE Standard for Digital Test Interchange Format (DTIF)


Abstract:

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic tes...Show More
Scope:This standard will define the test program set data embodied in a number of ASCII files for stimulus, response, and diagnostics of digital systems for use on digital Auto...Show More
Purpose:This standard will develop a definition of digital test information for digital test systems to cover UUT Model, stimulus/response, fault dictionary, probe data, and othe...Show More

Abstract:

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deÞned. This information can be broadly grouped into data that deÞnes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
Scope:
This standard will define the test program set data embodied in a number of ASCII files for stimulus, response, and diagnostics of digital systems for use on digital Automatic Test Systems.
Purpose:
This standard will develop a definition of digital test information for digital test systems to cover UUT Model, stimulus/response, fault dictionary, probe data, and other forms of data. Any existing defacto standards will be given precedence.
Date of Publication: 10 March 1999
Electronic ISBN:978-0-7381-1554-2
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=6086

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