Information to assist users of gaskets in evaluating gasket measurement techniques to determine which exhibit the properties critical to the intended application, to highlight limitations and sources of error of the competing measurement techniques, and to provide a basis for comparing the techniques is provided in this guide. Emphasis is placed on those measurement techniques that have been adopted through incorporation into standards, both commercial and military, or that have been used extensively.

The scope of this guide is to provide manufacturers of gaskets and designers of electronic systems appropriate methods for the characterization of gaskets. This document will guide the user in the selection of the appropriate test method in order to determine the level of shielding provided in the intended application.

The purpose of this guide is to provide guidance on the strengths and weaknesses of each of the recommended methods, and provide in-depth documentation for each method. Therefore, it identifies limitations and sources of errors of the commonly accepted techniques for measuring gaskets, and provides a basis for comparing the various accepted techniques. It encompasses measurements of the as-installed behavior of gaskets as well as manufacturing-related quality control measurements. Special attention is also given to test methods for small samples of gaskets (also above 1 GHz), correlation between different methods, and to identify possible measuring methods for near-field characterization of gaskets [as used on printed circuit board (PCB) board applications].