Abstract:
Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable...Show MoreMetadata
Abstract:
Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV are provided in this standard.
Date of Publication: 08 May 2008
Electronic ISBN:978-0-7381-5348-3
ICS Code: 29.120.20 - Connecting devices
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=4512332
