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1160-1993 - IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors | IEEE Standard | IEEE Xplore

1160-1993 - IEEE Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors

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Abstract:

This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays a...Show More
Scope:This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma ra...Show More
Purpose:The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium ...Show More

Abstract:

This standard applies to the measurement of bulk properties of high-purity germanium as they relate to fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity center per cm3, usually on the order of 1010 cm-3.
Scope:
This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3, usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-19
Purpose:
The purpose of this standard is to establish uniform procedures for measurements and analyses in the determination and reporting of bulk properties relevant to germanium radiation detector fabrication and performance. These properties are net electrically active impurity concentrations, |NA – ND|, the concentration of isolated defects with deep electronic levels NT, and certain crystallographic properties. The techniques described herein are those that have found general use in the industry, are practical, and provide verifiable and desired information to the detector fabricator. As an aid to the reader, an annex is included for background material. Paragrap...
Date of Publication: 25 May 1993
Electronic ISBN:978-0-7381-0726-4
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=2821

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