Abstract:
This IEEE Standards product is part of the C37 family on Switchgear, Substations and Protective Relays. Guidelines are established for synthetic testing of circuit breake...Show MoreScope:This guide is intended to provide a basis for synthetic testing of circuit breakers (see ANSI/IEEEC37.04-1979 [2]) and to establish the criteria for testing to demonstrat...Show More
Purpose:The purpose of this guide is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish validity of the test metho...Show More
Metadata
Abstract:
This IEEE Standards product is part of the C37 family on Switchgear, Substations and Protective Relays. Guidelines are established for synthetic testing of circuit breakers, as well as test criteria for demonstrating the short-circuit current rating of circuit breakers on a single-phase basis. Criteria for evaluating results are also provided. The standard covers short-circuit current interruption process; basic principles of synthetic testing; synthetic test circuits; requirements for synthetic test methods; parameters, test procedures, and tolerances; short-line fault; multiple loops; circuit breakers equipped with parallel impedance; duty cycle; and test records.
Scope:
This guide is intended to provide a basis for synthetic testing of circuit breakers (see ANSI/IEEEC37.04-1979 [2]) and to establish the criteria for testing to demonstrate the short-circuit current rating of circuit breakers on a single phase basis. It is recognized that other test requirements exist (such as capacitor switching, or line dropping) but they will be reserved for future consideration. The guide contains typical circuits for demonstrating interrupting capability. These circuits are those in general use and their inclusion should not exclude the development of additional circuits to demonstrate specific capabilities.
Purpose:
The purpose of this guide is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish validity of the test method without imposing restraints on innovation and improvement of test circuitry.
Date of Publication: 12 June 1981
Electronic ISBN:978-0-7381-1038-7
ICS Code: 29.120.40 - Switches
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=2554