Abstract:
This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; M...Show MoreMetadata
Abstract:
This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.<>
Date of Publication: 31 December 1988
Electronic ISBN:0-7381-4235-2
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=2525