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592-1990 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors | IEEE Standard | IEEE Xplore
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592-1990 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors

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Abstract:

This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifica...Show More
Scope:This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specificall...Show More

Metadata

Abstract:

This standard provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
Scope:
This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.
Date of Publication: 05 February 1991
Electronic ISBN:978-0-7381-3749-0
DOI: 10.1109/IEEESTD.1991.101051
ICS Code: 29.120.20 - Connecting devices
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=2254

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