This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified, and dozens of commonly used terms are clearly defined, to aid communication about the quality of tested ICs

This standard defines a defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs). The portion of all possible defects that are detected, or "covered", by tests of analog and mixed-signal circuits depends, in practice, on many factors (detectability, defect characteristics, detection threshold margin, measurement resolution, operating point, test patterns, etc.), which this standard considers as it defines how to report coverage. This standard focuses on defects in analog functions. In this context, "defect" is an observable unintended physical change in a circuit, and an "analog function" means a func...

The primary purpose of this standard is to allow people to communicate information about defect coverage in a way that allows assessment of test and circuit quality as well as prediction of important metrics (simulation time, DfT circuit area, test time, test escapes, etc.). Given a circuit description and a test pattern, this standard defines how to enumerate the universe of defects, determine which defects are detected by the test pattern, and report the coverage results. By defining analog test coverage, this standard is useful for several other purposes. First, this standard guides efficient simulation of defects to ensure that the defect models achieve ...