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P2818/VITA 51.4/D13, Jun 2024 - IEEE Approved Draft Standard for Reliability Component Stress Analysis and Derating Specification | IEEE Standard | IEEE Xplore

P2818/VITA 51.4/D13, Jun 2024 - IEEE Approved Draft Standard for Reliability Component Stress Analysis and Derating Specification

Status: inactive - Draft
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Abstract:

This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing...Show More
Scope:This specification establishes uniform methods for increasing a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, tempera...Show More
Purpose:The objective of stress analysis and derating is to improve product reliability by deliberately operating components at applied stress levels (i.e., voltage, current, tem...Show More

Abstract:

This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
Scope:
This specification establishes uniform methods for increasing a component’s reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part.
Purpose:
The objective of stress analysis and derating is to improve product reliability by deliberately operating components at applied stress levels (i.e., voltage, current, temperature, power, etc.) that are below their rated capacity. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
Date of Publication: 18 June 2024
Electronic ISBN:979-8-8557-0917-9
Persistent Link: https://ieeexplore.ieee.org/servlet/opac?punumber=10565811

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